MC14007UB 多功能器件包含三个 N 沟道和三个 P 沟道增强模式器件,每个器件都可访问。这些通用零件可用于逆变器电路、脉冲整形器、线性放大器、高输入阻抗放大器、阈值检测器、传输门控和功能门控。
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MSL Temp (°C)
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VCC Min (V)
VCC Max (V)
tpd Max (ns)
PD Max (W)
IO Max (mA)
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MC14007UBDG
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MC14007UBDR2G
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NLV14007UBDR2G
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可靠性数据
Die Related Summary Data
Device: MC14007UBDG
Equivalent to wafer fab process: CMOS STD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
3
3597164517
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)