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The MC74VHC1GT00 is a single gate 2-input NAND fabricated with silicon gate CMOS technology.
The internal circuit is composed of multiple stages, including a buffer output which provides high noise immunity and stable output.
The device input is compatible with TTL-type input thresholds and the output has a full 5 V CMOS level output swing. The input protection circuitry on this device allows overvoltage tolerance on the input, allowing the device to be used as a logic-level translator from 3.0 VCMOS logic to 5.0 V CMOS Logic or from 1.8 V CMOS logic to 3.0 V CMOS Logic while operating at the high-voltage power supply.
The MC74VHC1GT00 input structure provides protection whenvoltages up to 5.5 V are applied, regardless of the supply voltage. This allows the MC74VHC1GT00 to be used to interface 5 V circuits to 3 V circuits. The output structures also provide protection when VCC = 0 V.
These input and output structures help prevent device destruction caused by supply voltage - input/output voltage mismatch, battery backup, hot insertion, etc.
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MC74VHC1GT00DBVT1G
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MC74VHC1GT00DFT1G
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MC74VHC1GT00DFT2G
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MC74VHC1GT00DFT2G-Q
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MC74VHC1GT00P5T5G
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可靠性数据
Die Related Summary Data
Device: M74VHC1GT00DFT1G
Equivalent to wafer fab process: ONC18
产品技术
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
ONC18
2
6465777234
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)