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B 系列逻辑门极是在单片结构中使用 P 和 N 沟道增强模式器件构建的(互补 MOS)。其主要用途是需要低功耗和/或高抗扰度的场合。
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MSL Temp (°C)
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VCC Min (V)
VCC Max (V)
tpd Max (ns)
IO Max (mA)
Reference Price
MC14071BDG
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MC14071BDR2G
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MC14071BDTR2G
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NLV14071BDR2G
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NLV14071BDTR2G
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可靠性数据
Die Related Summary Data
Device: MC14071BDG
Equivalent to wafer fab process: CMOS STD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
3
3597164517
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)