碳化硅肖特基二极管没有开关损耗,由于采用新型半导体材料——碳化硅,提供比硅二极管更高的系统效率,支持更高的运行频率,并且有助于提高功率密度和减少系统尺寸/成本。 其高可靠性确保浪涌或过压状况下的稳健运行
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FFSP3065A
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可靠性数据
Die Related Summary Data
Device: FFSP3065A
Equivalent to wafer fab process: SIC
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
SIC
0
3855921070
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)