模拟多路复用器/信号分离器 (Mux/Demux)
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高性能硅门极 CMOS MC74HC4051A、MC74HC4052A 和 MC74HC4053A 使用硅门极 CMOS 技术来实现快速传播延迟、低导通电阻和低关断漏电流。这些模拟多路复用器/信号分离器控制在整个电源范围(从 VCC 到 VEE)内变化的模拟电压。HC4051A、HC4052A 和 HC4053A 与金属门极 MC14051AB、MC14052AB 和 MC14053AB 的引脚输出相似。沟道选择输入通过模拟开关决定将哪个模拟输入/输出连接到公用输出/输入。启用引脚为高电平时,所有模拟开关都关闭。沟道选择和启用输入与标准 CMOS 输出兼容;带上拉电阻,它们与 LSTTL 输出兼容。此类器件的设计使得基于输入电压的导通电阻 (Ron) 比金属门极 CMOS 模拟开关的 Ron 的线性更强。有关带注入电流保护的多路复用器/信号分离器,请参见 HC4851A 和 HC4852A。
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Die Related Summary Data
Device: NLVHC4053ADWR2G
Equivalent to wafer fab process: CMOS SUB
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平均故障间隔时间/平均无故障时间(按小时计算)
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CMOS SUB
2
920154574
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)