Specific Function Optocouplers | H11F1M

6 引脚 DIP 双向模拟 FET 输出光耦合器

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概览

H11FXM 系列由一个与对称双向硅光电检测器耦合的砷铝镓红外发光二极管组成。该检测器可与输入进行电气隔离，就好像一个理想隔离的 FET，适用于低电平交流和直流模拟信号的无失真控制。H11FXM 系列器件安装在双线内封装内。

  • 消费型设备
  • 工业级电机

  • 作为一个远程可变电阻：
  • ≤ 100Ω至≥ 300MΩ
  • ≤ 15pF分流电容
  • ≥ 100GΩ I/O隔离电阻作为模拟开关：
  • 极低失调电压
  • 60 Vpk-pk信号能力
  • 无电荷注入或闩锁
  • UL认证（文件编号E90700）

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VCC (Max) (V)

VCC (Min) (V)

VOL (Max) (V)

ICCL (Max) (mA)

II (ON) RMS (Min) (mA)

II (OFF) RMS (Max) (mA)

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H11F1M

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CAD Model

Pb

A

H

P

PDIP-6

646BX

NA

0

BLKBG

1000

Y

30

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-

-

-

0.05

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25

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7500

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$0.4413

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H11F1SM

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CAD Model

Pb

A

H

P

PDIP-6

646BY

1

260

BLKBG

1000

Y

30

-

-

-

-

0.05

-

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200

25

25

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H11F1SR2M

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CAD Model

Pb

A

H

P

PDIP-6

646BY

1

260

BLKBG

1000

Y

30

-

-

-

-

0.05

-

-

30

50

200

25

25

7500

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$0.4753

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H11F1TVM

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CAD Model

Pb

A

H

P

PDIP-6

646BZ

NA

0

BLKBG

1000

Y

30

-

-

-

-

0.05

-

-

30

50

200

25

25

7500

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$0.4413

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H11F1VM

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CAD Model

Pb

A

H

P

PDIP-6

646BX

NA

0

BLKBG

1000

Y

30

-

-

-

-

0.05

-

-

30

50

200

25

25

7500

-40

100

$0.4413

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可靠性数据

Die Related Summary Data

Device: H11F1M

Equivalent to wafer fab process: BN,GA

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等效器件小时

平均故障间隔时间/平均无故障时间（按小时计算）

FITS

BN,GA

0

252701301

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Re-calculate Data

Data is based on the following assumptions.

Note: The temperature and confidence level may be adjusted to your requirements.

Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)

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