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FODM306X 和 FODM308X 系列由于单片式硅检测器进行光耦合的红外发光二极管组成,执行零电压较差双向三端可控硅的功能,采用紧凑型的 4 引脚微型扁平封装。引线间距为 2.54mm。它们与双向三端可控硅一起用于逻辑系统与 115/240 VAC 线路供电设备的接口中,如固态继电器、工业控制器、电机、电磁装置和消费设备。
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MSL Temp (°C)
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VDRM (Min) (V)
IFT (Max) (mA)
VTM (Max) (V)
Static dV/dt (Min)
Commutating dV/dt (Min)
IH (Typ)
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FODM3083
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FODM3083R2
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可靠性数据
Die Related Summary Data
Device: FODM3083
Equivalent to wafer fab process: BN,GA
产品技术
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
BN,GA
0
252701301
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)