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FPF2260ATMX is an OVP and UVLO controller with reverse / negative voltage protection. The device controls and drives a pair of external N−MOSFET that can operate over an input voltage range of 2.8 V to 23 V. In that way, with OVP feature implemented, the system can allow huge current as long as the external MOSFET can handle.When the input voltage exceeds the over−voltage threshold or lower than under−voltage threshold, the external FET is turned off immediately to prevent damage to the protected downstream components.When the input voltage is stressed a negative voltage, the external FET will also be turned off and prevent OUT dropping to negative voltage.FPF2260ATMX is available in a small X2QFN12 package and operate over the free−air temperature range of −40°C to +85°C.
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Package Type
Case Outline
MSL Type
MSL Temp (°C)
Container Type
Container Qty.
ON Target
Over Current - Shutdown (Y/N)
Over Current - Current Source (Y/N)
Current Limit (FIXED/ADJ/NO)
Over Voltage Protection (Y/N)
Reverse Current Blocking (Y/N)
FAULT Signal (Y/N)
PGOOD (Y/N)
UVLO (Y/N)
Rds(on) Typ (mΩ)
Max Current (A)
Output Discharge (Y/N)
IMON Output (Y/N)
Adjustable Slew Rate (Y/N)
Vin Min (V)
Vin Max (V)
Iq (µA)
eFuse / Hot Plug (Y/N)
Input / Output
Product Family
Reference Price
FPF2260ATMX
Active
Pb
A
H
P
X2QFN-12
1
260
REEL
5000
F
N
N
-
Y
Y
N
Y
Y
-
-
N
N
N
4
22
160
N
-
IntelliMAX
$0.2147
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可靠性数据
Die Related Summary Data
Device: FPF2260ATMX
Equivalent to wafer fab process: BD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
BD
0
1595257088
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)