NIS6150是一款具有性价比的可复位电子熔丝,可大大提升USB应用的可靠性,预防灾难性故障和停机故障的发生。它能够帮助负载设备对过高的输入电压进行缓冲,保护敏感电路不受损坏,并保护输入侧电路不受反相电流影响。它还包括一个过压钳位电路,可在瞬态期间限制输出电压,但不会关闭设备,从而允许负载电路继续运行。
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可靠性数据
Die Related Summary Data
Device: NIS6150MT1TXG
Equivalent to wafer fab process: TRENCH FET LEGACY
产品技术
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
TRENCH FET LEGACY
2
25072444968
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)