Voltage Supervisors | MC33161

电压监控器，通用电压监视器

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概览

MC34161/MC33161/NCV33161通用电压监视器，可用于多种电压监测应用。此类器件为电路设计者提供了一个用于正负电压侦测的经济方案。电路包括两个比较器通道且均带有迟滞、用于通道编程的独特模式选择输入（Mode Select Input）和带引脚输出2.54V电压基准，以及两个开路收集器输出，灌电流能力超过10mA。每个比较器通道均可通过模式选择输入配置为逆向或非逆向，由此实现正电压和负电压的过压、欠压和窗口检测。正电压监测完全运行所需的最低电源电压为2.0V，负电压为4.0V。应用包括电器、汽车、消费电子和工业设备中使用的正负电压直接监控。

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  • 独特的模式选择输入（Mode Select Input）实现通道编程
  • 过压、欠压和窗口电压侦测
  • 正负电压侦测
  • 正电压监测完全运行时电压为2.0 V，负电压监测完全运行时电压为 4.0 V
  • 带电流限制保护的2.54 V引脚输出电压基准
  • 低待机电流
  • 集电极开路输出可提高设备灵活性
  • 可选无铅封装
  • 可选NCV版本用于汽车应用

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MC33161DG

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CAD Model

Pb

A

H

P

SOIC-8

751-07

1

260

TUBE

98

N

2

40

1.27

450

Low

No

No

No

$0.4912

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MC33161DMR2G

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CAD Model

Pb

A

H

P

Micro8

846A-02

1

260

REEL

4000

Y

2

40

1.27

450

Low

No

No

No

$0.5572

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MC33161DR2G

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Active

CAD Model

Pb

A

H

P

SOIC-8

751-07

1

260

REEL

2500

Y

2

40

1.27

450

Low

No

No

No

$0.4554

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MC34161DG

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Active

CAD Model

Pb

A

H

P

SOIC-8

751-07

1

260

TUBE

98

N

2

40

1.27

450

Low

No

No

No

$0.5279

More Details

MC34161DMR2G

Contact Sales

Active

CAD Model

Pb

A

H

P

Micro8

846A-02

1

260

REEL

4000

N

2

40

1.27

450

Low

No

No

No

$0.5279

More Details

MC34161DR2G

Contact Sales

Active

CAD Model

Pb

A

H

P

SOIC-8

751-07

1

260

REEL

2500

N

2

40

1.27

450

Low

No

No

No

$0.5279

More Details

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可靠性数据

Die Related Summary Data

Device: MC33161DG

Equivalent to wafer fab process: BP STD LINEAR

产品技术

产品技术

等效器件小时

平均故障间隔时间/平均无故障时间（按小时计算）

FITS

BP STD LINEAR

10

12120914040

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Re-calculate Data

Data is based on the following assumptions.

Note: The temperature and confidence level may be adjusted to your requirements.

Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)

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