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NCP/NCV300 和 NCP/NCV301 系列是第二代超低电流电压检测器。此类器件专门用作重置控制器,适用于较长电池寿命至关重要的、基于便携式微处理器的系统。每个系列均具有带有迟滞的高准确度欠电压检测器,防止超过比较器阈值时的错误系统重置运行。NCP/NCV300 系列由互补输出器件组成,并提供有效高电平或有效低电平重置。NCP301 系列具有开路漏极 N 沟道输出,且带有有效高电平或有效低电平重置输出。NCP/NCV300 和 NCP/NCV301 系列器件采用带标准欠电压阈值的 SOT23-5 封装。还可以 100 mV 步级生产从 0.9 V 到 4.9 V 的其他阈值。
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NCV301LSN22T1G
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NCV301LSN28T1G
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NCV301LSN33T1G
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NCV301LSN40T1G
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NCV301LSN42T1G
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可靠性数据
Die Related Summary Data
Device: NCV301LSN22T1G
Equivalent to wafer fab process: CMOS STD
产品技术
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
3
3597164517
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)