NCP/NCV302和NCP/NCV303系列是第二代超低电流电压监测器,包含一个可编程时间延迟生成器。专门用于重置控制器,适用于需要延迟电池寿命、基于便携式微处理器的系统。
每个系列均具备带迟滞的高准确度欠电压检测器,以及外部可编程时间延迟生成器。这种功能组合可防止错误的系统重置运行。NCP/NCV302系列由互补输出器件组成,并提供有效高电平或有效低电平重置。NCP/NCV303系列具有开路漏极 N沟道输出,带有效低电平重置输出。
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NCV303LSN09T1G
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NCV303LSN10T1G
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NCV303LSN16T1G
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NCV303LSN20T1G
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NCV303LSN29T1G
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NCV303LSN30T1G
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NCV303LSN42T1G
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NCV303LSN44T1G
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NCV303LSN45T1G
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NCV303LSN46T1G
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可靠性数据
Die Related Summary Data
Device: NCV303LSN09T1G
Equivalent to wafer fab process: CMOS STD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
3
3597164517
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)