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KDT00030 / KDT00030A 为小尺寸,薄型光电检测器。它们结合了一个光电晶体管检测芯片,因此适用于移动设备背光照明灯低成本环境光测量应用。
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CAD Models
Compliance
Package Type
Case Outline
MSL Type
MSL Temp (°C)
Container Type
Container Qty.
ON Target
IOTyp (µA)
Output Interface
Vin Min (V)
Vin Max (V)
TA Min (°C)
TA Max (°C)
Reference Price
KDT00030ATR
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KDT00030TR
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可靠性数据
Die Related Summary Data
Device: KDT00030ATR
Equivalent to wafer fab process: PD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
PD
0
206924763
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)