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CAT34TS00 is a low-voltage digital temperature sensor, which implements the JEDEC JC42.4 specification. CAT34TS00 measures temperature every 100 ms over a range of -20°C to +125°C, with a resolution of 12 bits. The host communicates with the device via the serial I2C / SMBus Interface, at either 100 kHz or 400 kHz. Temperature readings can be retrieved via serial interface. Internally, they are compared to high, low and critical trigger limits stored in device registers. Over or under limit conditions can be signaled on the open−drain EVENT pin. These limits, as well as other settings, can be configured via serial interface.
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MSL Temp (°C)
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ICC Max (mA)
VCC Min (V)
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CAT34TS00VP2GT4A
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可靠性数据
Die Related Summary Data
Device: CAT34TS00VP2GT4A
Equivalent to wafer fab process: CMOS SUB
产品技术
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS SUB
2
920154574
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)