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CAT34TS02 将符合 JC42.4 标准的温度传感器 (TS) 与 2-Kb 顺序内存指示位检测 (SPD) EEPROM 相结合。该 TS 以至少每秒 10 次的频率测量温度。温度读数可由主机通过串行接口检索,并与存储在内部寄存器内的高、低和临界触发限值进行比较。超过限值或低于限值情况可在开漏 EVENT 引脚上发出信号。集成式 2-Kb SPD EEPROM 内部组织为 16 页,每页 16 字节,总共 256 字节。它具有 16 字节页写入缓存,支持标准 (100 kHz) 和快速 (400 kHz) I2C 协议。对下半区内存的写入操作可以通过软件命令进行抑制。CAT34TS02 具有 DDR3 DIMM 规定的永久性和可逆性软件写保护。
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CAT34TS02VP2GT4C
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Die Related Summary Data
Device: CAT34TS02VP2GT4C
Equivalent to wafer fab process: CMOS SUB
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS SUB
2
920154574
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)