生命周期终止
FSUSB242 开关为 HSD+/HSD- 线路提供高电压和电涌保护。 电涌正在逐渐成为 USB microB 和 USB Type-C™ 等小外形联接器的一个重要问题。此产品提供 2:1 开关,同时能够保持充分的信号完整性,因此仍然可以通过 USB 2.0 HS 眼图。
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ron Max (Ω)
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可靠性数据
Die Related Summary Data
Device: FSUSB242UCX-Z002
Equivalent to wafer fab process: CMOS SUB
产品技术
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS SUB
3
7566029322
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)