MC14094B 组合了 8 级移位寄存器,每级都带有一个数据锁存,每个锁存有一个三态输出。数据在正向时钟转换时进行移位,从第七级移位到两个串行输出。QS 输出数据用于高速级联系统。QS 输出数据在下一个负向时钟转换时发生移位,用于低速级联系统。来自移位寄存器每级的数据在选通输入的负向转换时进行锁存。选通处于高电平时,数据通过该锁存进行传播。八个数据锁存的输出由三态缓冲器控制,这些缓冲器由输出启用上的逻辑低电平置于高阻抗状态。
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可靠性数据
Die Related Summary Data
Device: MC14094BDG
Equivalent to wafer fab process: CMOS STD
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
4
5047673171
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)