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N34TS04 是温度传感器 (TS) 和 4 kb 串行存在检测 (SPD) EEPROM 的组合体,实现了 JEDEC TSE2004av DDR4 规范。TS 每秒钟至少测量 10 次温度。主机可以通过串行接口检索温度读数,并与存储在内部寄存器中的高、低和临界触发器限值进行比较。如超过或低于限制条件,可在开路漏极 EVENT 引脚上发出信号。4 Kb 存储器被划分为两个单独可寻址的 2 Kb 库(参考 TSE2004av 规范中的 SPD 页面)。每个库包含两个 1 Kb 块,可以通过可逆软件写保护 (RSWP) 命令予以写保护。SPD EEPROM 具有 16 字节宽的写缓冲区,支持标准 (100 kHz)、Fast (400 kHz) 和 Fast Plus (1 MHz) I2C 协议。
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ON Target
Type
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Data Transmission Standard
fcycle Max (kHz)
tACC Max ns
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VCC Max (V)
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Reference Price
N34TS04MT3ETG
Active
Pb
A
H
P
TDFN-8
1
260
REEL
4000
N
Serial
4 kb
512 x 8
I2C
1000
300
1.7
5.5
-
10
1
-40
125
-
-
$0.2964
More Details
N34TS04MU3ETG
Active
Pb
A
H
P
UDFN-8
1
260
REEL
4000
N
Serial
4 kb
512 x 8
I2C
1000
300
1.7
5.5
-
10
1
-40
125
-
-
$0.2913
More Details
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可靠性数据
Die Related Summary Data
Device: N34TS04MT3ETG
Equivalent to wafer fab process: CMOS SUB
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS SUB
2
920154574
More Details
Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)