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安森美半导体串行 SRAM 系列包括多款集成存储器件,其中就包括这款 64 K 串行访问的静态随机访问存储器,内部组织为 8 K 个词,每个词 8 位。此类器件采用安森美半导体先进的 CMOS 工艺制造,速度快、功耗低。此类器件通过一个单芯片选择 (CS) 输入运行,并使用一个简单的串行外围接口 (SPI) 串行总线。单个数据输入和数据输出行与时钟一起用于访问器件中的数据。N64S830HA 器件包括暂停引脚,可实现与要暂停器件的通信。暂停后,输入转换将忽略。此类器件可在 −40°C 至 +85°C 的宽广温度范围内运行,采用若干标准封装。
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N64S830HAS22I
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N64S830HAT22I
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可靠性数据
Die Related Summary Data
Device: N64S830HAS22I
Equivalent to wafer fab process: ONC18
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
ONC18
2
6465777234
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)
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