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MC14099B 和 MC14599B 是 8 位可寻址锁存。对相应的锁存寻址(通过地址引脚 A0、A1、A2)且写禁用处于低电平状态时,数据以串行形式输入。芯片启用必须为高电平,以便写入 MC14599B。对于 MC14599B,数据引脚是一个双向数据端口;而对于 MC14099B,输入是一个单向只写端口。写/读行控制 MC14599B 中的这一端口。数据在 8 个锁存的输出端并行显示,与写禁用、写/读或芯片启用的状态无关。这两个零部件都具备主重置功能。
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MSL Temp (°C)
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VCC Min (V)
VCC Max (V)
tpd Max (ns)
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MC14099BDWG
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MC14099BDWR2G
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NLV14099BDWR2G
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可靠性数据
Die Related Summary Data
Device: NLV14099BDWR2G
Equivalent to wafer fab process: CMOS STD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
3
3597164517
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Re-calculate Data
Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)