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MC14511B BCD-7 段锁存/解码器/驱动器在一个单片结构中使用互补 MOS (CMOS) 增强模式器件和 NPN 双击输出驱动器构造。该电路提供 4 位存储锁存、8421 BCD-7 段解码器和输出驱动器的功能。灯测试 (LTbar)、间隔 (BIbar) 和锁存启用 (LE) 输入分别用于测试显示屏、关闭或脉冲调制显示屏的亮度,以及存储 BCD 编码。它还可直接或间接用于七段发光二极管 (LED)、白炽灯、荧光灯、气体排放或液晶显示。应用包括仪器(如计数器、DVM 等)显示驱动器、计算机/计算器显示驱动器、操舵显示驱动器和各种时钟、表和计时器。
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MC14511BDG
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MC14511BDR2G
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MC14511BDWR2G
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NLV14511BDWR2G
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可靠性数据
Die Related Summary Data
Device: NLV14511BDWR2G
Equivalent to wafer fab process: CMOS STD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
3
3597164517
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)