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The MC74AC/74ACT132 contains four 2-input NAND gates which are capable of transforming slowly changing input signals into sharply defined, jitter-free output signals. In addition, they have greater noise margin than conventional NAND gates.
Each circuit contains a 2-input Schmitt trigger. The Schmitt trigger uses positive feedback to effectively speed-up slow input transitions, and provide different input threshold voltages for positive and negative-going transitions. This hysteresis between the positive-going and negative-going input threshold is determined by resistor ratios and is essentially insensitive to temperature and supply voltage variations.
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MC74AC132DG
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MC74AC132DR2G
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可靠性数据
Die Related Summary Data
Device: MC74AC132DG
Equivalent to wafer fab process: CMOS SUB
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等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS SUB
2
920154574
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)