Multiplexers | NLHV4157N

负电压 SPDT 开关

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概览

NLHV4157N 是一款先进的 CMOS 模拟开关，采用硅门极 CMOS 工艺制造。此器件传递可能会在整个电源范围（从 VEE 到 GND）范围内变化的模拟和数字负电压。

  • GaN Transistor Power Amplifiers

  • Cell Phone Towers

  • Operating Voltage Range
  • Switch Signal Voltage Range
  • Positive Control Signal Voltage
  • Low ON Resistance
  • Latch−up Performance
  • Small Packaging
  • These Devices are Pb−Free, Halogen−Free/BFR-Free and are RoHS−Compliant

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NLHV4157NDFT2G

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Pb

A

H

P

SC-88-6 / SC-70-6 / SOT-363-6

419B-02

1

260

REEL

3000

Y

1

-12

-4

2

±50

$0.0795

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可靠性数据

Die Related Summary Data

Device: NLHV4157NDFT2G

Equivalent to wafer fab process: ONC18

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等效器件小时

平均故障间隔时间/平均无故障时间（按小时计算）

FITS

ONC18

2

6465777234

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Data is based on the following assumptions.

Note: The temperature and confidence level may be adjusted to your requirements.

Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)

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