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ON Semiconductor
EVBUM2553DB - KAE-0815x TEC Image Sensor Evaluation Kit
The ON Semiconductor KAE−0815x TEC image sensor
evaluation kit enables customers to evaluate the
performance of KAE−08151 and KAE−08152 Interline
Transfer EMCCD image sensors that include an integrated
thermoelectric cooler (TEC) without the need to develop a
full camera design. When combined with
ON Semiconductor SensorStudio software, the kit allows
easy camera control such as VGA/CDS gains, black levels,
integration time, electron multiplication factor and readout
configuration (single / dual / quad). Image capture and
analysis functions such as video recording, still image
capture, gain merging and image analysis are also
supported.
Separate part numbers are available to evaluate devices
with either standard or enhanced NIR sensitivity in
monochrome, color, and Sparse CFA configurations where
available. Separate product configurations with an
integrated TEC can also be evaluated using this hardware by
purchasing individual image sensors. Please see ordering
information for more details. Individual components of this
kit are also available in an à la carte manner. Please contact
your ON Semiconductor sales representative for more
details.
US export controls apply to shipments of IT−EMCCD
devices designated for destinations outside of the US and
Canada. Please contact your ON Semiconductor sales
representative for more details.
2019-11-12T16:16:41+08:00
BroadVision, Inc.
2019-11-12T16:17:15+08:00
2019-11-12T16:17:15+08:00
Acrobat Distiller 19.0 (Windows)
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