Reliability Data - Device MTBF/MTTF/FIT

Device: NCV97400MW00R2G
Equivalent to wafer fab process: I3T

Die Related Summary Data






I3T 4

Data is based on the following assumptions:

Activation Energy (constant) 0.7 electron-volts
Junction Temperature (25 - 175) Celsius
One-sided Upper Confidence Level percent

Note: The temperature and confidence level may be adjusted to your requirements.
Click the 'Calculate' button when set.

A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard), onsemi can calculate the raw FIT rate according to generic standards (IEC62380, IEC61709, SN29500, FIDES, etc.) or provide, when available, functional safety related documentation to allow for the integration of the components into the system. Support can be requested by sending an email to

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