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Reliability Data - Device MTBF/MTTF/FIT

Device: MMUN2136LT1G
Equivalent to wafer fab process: SST

Die Related Summary Data

产品技术

废品

等效器件小时

平均故障间隔时间/平均无故障时间（按小时计算）

FITS
SST 0

Data is based on the following assumptions:

Activation Energy (constant) 0.7 electron-volts
Junction Temperature (25 - 175) Celsius
One-sided Upper Confidence Level percent

Note: The temperature and confidence level may be adjusted to your requirements.
Click the 'Calculate' button when set.

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