Device: MMUN2136LT1G
Equivalent to wafer fab process: SST
Data is based on the following assumptions:
Note: The temperature and confidence level may be adjusted to your requirements.
Click the 'Calculate' button when set.
Disclaimer:
A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)