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MC14175B 四路 D 型触发器采用一个单片结构,使用 MOS P 沟道和 N 沟道增强型器件进行构造。四个触发器中的每一个都是由公用时钟输入 (C) 触发的上升沿。有效低电平重置输入 (R) 异步重置所有触发器。每个触发器都具有独立的数据 (D) 输入和互补输出(Q 和 Qbar)。这些器件可用作移位寄存器元件,或用于计数器和切换应用的 T 型触发器。
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tpd Max (ns)
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MC14175BDG
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MC14175BDR2G
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NLV14175BDR2G
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可靠性数据
Die Related Summary Data
Device: MC14175BDG
Equivalent to wafer fab process: CMOS STD
产品技术
产品技术
等效器件小时
平均故障间隔时间/平均无故障时间(按小时计算)
FITS
CMOS STD
3
3597164517
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Data is based on the following assumptions.
Note: The temperature and confidence level may be adjusted to your requirements.
Disclaimer: A reliability FIT rate calculated using this tool shall not be used for any functional safety purpose. In case a raw FIT rate needs to be estimated for a component which is targeted to be used in a safety critical application (i.e. compliant to ISO 26262 standard) it should be calculated according to generic safety standards (IEC62380, IEC61709, SN29500, FIDES, etc.)